Advanced measurement and test : selected, peer reviewed papers from the 2010 International Conference on Advanced Measurement and Test (AMT 2010), May 15-16, 2010, Sanya, P.R. China / edited by Yanwen Wu.
Material type:
TextSeries: Key engineering materials ; v. 439-440.Publisher: Stafa-Zurich, Switzerland ; Enfield, N.H. : Trans Tech Publications, [2010]Copyright date: ©2010Description: 2 volumes (various pagings) : illustrations ; 25 cmContent type: - text
- unmediated
- volume
- 0878492712
- 9780878492718
- International Conference on Advanced Measurement and Test
- AMT 2010
- 621.381548 22
| Item type | Current library | Call number | Vol info | Copy number | Status | Date due | Barcode | |
|---|---|---|---|---|---|---|---|---|
| Book | City Campus City Campus Main Collection | 621.381548 INT (Browse shelf(Opens below)) | Pt. 1 | 1 | Available | A452098B | ||
| Book | City Campus City Campus Main Collection | 621.381548 INT (Browse shelf(Opens below)) | Pt. 2 | 1 | Available | A452099B |
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Includes bibliographical references and index.
Machine converted from AACR2 source record.
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