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Advanced measurement and test : selected, peer reviewed papers from the 2010 International Conference on Advanced Measurement and Test (AMT 2010), May 15-16, 2010, Sanya, P.R. China / International Conference on Advanced Measurement and Test AMT 2010 edited by Yanwen Wu. - 2 volumes (various pagings) : illustrations ; 25 cm. - Key engineering materials, v. 439-440 1013-9826 ; . - Key engineering materials ; v. 439-440. .

Includes bibliographical references and index.

ISBN: 0878492712 9780878492718

Subjects--Topical Terms:
Electric measurements--Congresses
Electronic measurements--Congresses
Materials--Testing--Congresses

Dewey Class. No.: 621.381548