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International Conference on Advanced Measurement and Test (2010 : Sanya Shi, China) (Meeting Name)

Number of records used in: 2
Preferred form: International Conference on Advanced Measurement and Test (2010 : Sanya Shi, China)
Used for/see from:
  • AMT 2010 (2010 : Sanya Shi, China)
  • Conference on Advanced Measurement and Test, International

THIS 1XX FIELD CANNOT BE USED UNDER RDA UNTIL THIS RECORD HAS BEEN REVIEWED AND/OR UPDATED

Progress in measurement and testing, 2010: t.p. (2010 International Conference on Advanced Measurement and Test (AMT 2010), May 15-16, 2010, Sanya, P.R. China)

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