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Electrical measurement, signal processing, and displays / edited by John G. Webster.

Contributor(s): Material type: TextTextSeries: Principles and applications in engineeringPublisher: Boca Raton : CRC Press, [2003]Copyright date: ©2003Description: various pagings : illustrations ; 27 cmContent type:
  • text
Media type:
  • unmediated
Carrier type:
  • volume
ISBN:
  • 0849317339
  • 9780849317330
Subject(s): DDC classification:
  • 621.381548 21
LOC classification:
  • TK7878 .E435 2003
Contents:
1. Voltage Measurement / Alessandro Ferrero, Jerry Murphy, Cipriano Bartoletti, Luca Podesta and Giancarlo Sacerdoti -- 2. Current Measurement / Douglas P. McNutt -- 3. Power Measurement / Pasquale Arpaia, Francesco Avallone, Aldo Baccigalupi, Claudio De Capua and Carmine Landi -- 4. Power Factor Measurement / Michael Z. Lowenstein -- 5. Phase Measurement / Peter O'Shea -- 6. Energy Measurement / Arnaldo Brandolini and Alessandro Gandelli -- 7. Electrical Conductivity and Resistivity / Michael B. Heaney -- 8. Charge Measurement / Saps Buchman, John Mester and Timothy J. Sumner -- 9. Capacitance and Capacitance Measurements / Halit Eren and James Goh -- 10. Permittivity Measurement / Devendra K. Misra -- 11. Electric Field Strength / David A. Hill and Motohisa Kanda -- 12. Magnetic Field Measurement / Steven A. Macintyre -- 13. Permeability and Hysteresis Measurement / Jeff P. Anderson and Richard J. Blotzer -- 14. Inductance Measurement / Michal Szyper -- 15. Immittance Measurement / Achim Dreher -- 16. Q Factor Measurement / Albert D. Helfrick -- 17. Distortion Measurement / Michael F. Toner and Gordon W. Roberts -- 18. Noise Measurement / W. Marshall Leach, Jr. -- 19. Microwave Measurement / A. Dehe, K. Beilenhoff, K. Fricke, H. Klingbeil, V. Krozer and H. L. Hartnagel -- 20. Amplifiers and Signal Conditioners / Ramon Pallas-Areny -- 21. Modulation / David M. Beams -- 22. Filters / Rahman Jamal and Robert Steer -- 23. Spectrum Analysis and Correlation / Ronney B. Panerai, A. Ambrosini, C. Bortolotti, N. D'Amico, G. Grueff, S. Mariotti, S. Montebugnoli, A. Orfei and G. Tomassetti -- 24. Applied Intelligence Processing / Peter H. Sydenham and Rodney Pratt -- 25. Analog-to-Digital Converters / E. B. Loewenstein -- 26. Computers / A. M. MacLeod, P. F. Martin and W. A. Gillespie -- 27. Telemetry / Albert Lozano-Nieto -- 28. Sensor Networks and Communication / Robert M. Crovella -- 29. Electromagnetic Compatibility / Daryl Gerke, William Kimmel and Jeffrey P. Mills -- 30. Human Factors in Displays / Steven A. Murray and Barrett S. Caldwell -- 31. Cathode Ray Tube Displays / Christopher J. Sherman -- 32. Liquid Crystal Displays / Kalluri R. Sarma -- 33. Plasma-Driven Flat Panel Displays / Robert T. McGrath, Ramanapathy Veerasingam, William C. Moffatt and Robert B. Campbell -- 34. Electroluminescent Displays / William A. Barrow -- 35. Light-Emitting Diode Displays / Mohammad A. Karim -- 36. Reading/Recording Devices / Herman Vermarien, Edward McConnell and Yufeng Li.
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Includes bibliographical references and index.

1. Voltage Measurement / Alessandro Ferrero, Jerry Murphy, Cipriano Bartoletti, Luca Podesta and Giancarlo Sacerdoti -- 2. Current Measurement / Douglas P. McNutt -- 3. Power Measurement / Pasquale Arpaia, Francesco Avallone, Aldo Baccigalupi, Claudio De Capua and Carmine Landi -- 4. Power Factor Measurement / Michael Z. Lowenstein -- 5. Phase Measurement / Peter O'Shea -- 6. Energy Measurement / Arnaldo Brandolini and Alessandro Gandelli -- 7. Electrical Conductivity and Resistivity / Michael B. Heaney -- 8. Charge Measurement / Saps Buchman, John Mester and Timothy J. Sumner -- 9. Capacitance and Capacitance Measurements / Halit Eren and James Goh -- 10. Permittivity Measurement / Devendra K. Misra -- 11. Electric Field Strength / David A. Hill and Motohisa Kanda -- 12. Magnetic Field Measurement / Steven A. Macintyre -- 13. Permeability and Hysteresis Measurement / Jeff P. Anderson and Richard J. Blotzer -- 14. Inductance Measurement / Michal Szyper -- 15. Immittance Measurement / Achim Dreher -- 16. Q Factor Measurement / Albert D. Helfrick -- 17. Distortion Measurement / Michael F. Toner and Gordon W. Roberts -- 18. Noise Measurement / W. Marshall Leach, Jr. -- 19. Microwave Measurement / A. Dehe, K. Beilenhoff, K. Fricke, H. Klingbeil, V. Krozer and H. L. Hartnagel -- 20. Amplifiers and Signal Conditioners / Ramon Pallas-Areny -- 21. Modulation / David M. Beams -- 22. Filters / Rahman Jamal and Robert Steer -- 23. Spectrum Analysis and Correlation / Ronney B. Panerai, A. Ambrosini, C. Bortolotti, N. D'Amico, G. Grueff, S. Mariotti, S. Montebugnoli, A. Orfei and G. Tomassetti -- 24. Applied Intelligence Processing / Peter H. Sydenham and Rodney Pratt -- 25. Analog-to-Digital Converters / E. B. Loewenstein -- 26. Computers / A. M. MacLeod, P. F. Martin and W. A. Gillespie -- 27. Telemetry / Albert Lozano-Nieto -- 28. Sensor Networks and Communication / Robert M. Crovella -- 29. Electromagnetic Compatibility / Daryl Gerke, William Kimmel and Jeffrey P. Mills -- 30. Human Factors in Displays / Steven A. Murray and Barrett S. Caldwell -- 31. Cathode Ray Tube Displays / Christopher J. Sherman -- 32. Liquid Crystal Displays / Kalluri R. Sarma -- 33. Plasma-Driven Flat Panel Displays / Robert T. McGrath, Ramanapathy Veerasingam, William C. Moffatt and Robert B. Campbell -- 34. Electroluminescent Displays / William A. Barrow -- 35. Light-Emitting Diode Displays / Mohammad A. Karim -- 36. Reading/Recording Devices / Herman Vermarien, Edward McConnell and Yufeng Li.

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