Image from Coce

Electrical measurement, signal processing, and displays / edited by John G. Webster.

Contributor(s): Material type: TextTextSeries: Principles and applications in engineeringPublisher: Boca Raton : CRC Press, [2003]Copyright date: ©2003Description: various pagings : illustrations ; 27 cmContent type:
  • text
Media type:
  • unmediated
Carrier type:
  • volume
ISBN:
  • 0849317339
  • 9780849317330
Subject(s): DDC classification:
  • 621.381548 21
LOC classification:
  • TK7878 .E435 2003
Contents:
1. Voltage Measurement / Alessandro Ferrero, Jerry Murphy, Cipriano Bartoletti, Luca Podesta and Giancarlo Sacerdoti -- 2. Current Measurement / Douglas P. McNutt -- 3. Power Measurement / Pasquale Arpaia, Francesco Avallone, Aldo Baccigalupi, Claudio De Capua and Carmine Landi -- 4. Power Factor Measurement / Michael Z. Lowenstein -- 5. Phase Measurement / Peter O'Shea -- 6. Energy Measurement / Arnaldo Brandolini and Alessandro Gandelli -- 7. Electrical Conductivity and Resistivity / Michael B. Heaney -- 8. Charge Measurement / Saps Buchman, John Mester and Timothy J. Sumner -- 9. Capacitance and Capacitance Measurements / Halit Eren and James Goh -- 10. Permittivity Measurement / Devendra K. Misra -- 11. Electric Field Strength / David A. Hill and Motohisa Kanda -- 12. Magnetic Field Measurement / Steven A. Macintyre -- 13. Permeability and Hysteresis Measurement / Jeff P. Anderson and Richard J. Blotzer -- 14. Inductance Measurement / Michal Szyper -- 15. Immittance Measurement / Achim Dreher -- 16. Q Factor Measurement / Albert D. Helfrick -- 17. Distortion Measurement / Michael F. Toner and Gordon W. Roberts -- 18. Noise Measurement / W. Marshall Leach, Jr. -- 19. Microwave Measurement / A. Dehe, K. Beilenhoff, K. Fricke, H. Klingbeil, V. Krozer and H. L. Hartnagel -- 20. Amplifiers and Signal Conditioners / Ramon Pallas-Areny -- 21. Modulation / David M. Beams -- 22. Filters / Rahman Jamal and Robert Steer -- 23. Spectrum Analysis and Correlation / Ronney B. Panerai, A. Ambrosini, C. Bortolotti, N. D'Amico, G. Grueff, S. Mariotti, S. Montebugnoli, A. Orfei and G. Tomassetti -- 24. Applied Intelligence Processing / Peter H. Sydenham and Rodney Pratt -- 25. Analog-to-Digital Converters / E. B. Loewenstein -- 26. Computers / A. M. MacLeod, P. F. Martin and W. A. Gillespie -- 27. Telemetry / Albert Lozano-Nieto -- 28. Sensor Networks and Communication / Robert M. Crovella -- 29. Electromagnetic Compatibility / Daryl Gerke, William Kimmel and Jeffrey P. Mills -- 30. Human Factors in Displays / Steven A. Murray and Barrett S. Caldwell -- 31. Cathode Ray Tube Displays / Christopher J. Sherman -- 32. Liquid Crystal Displays / Kalluri R. Sarma -- 33. Plasma-Driven Flat Panel Displays / Robert T. McGrath, Ramanapathy Veerasingam, William C. Moffatt and Robert B. Campbell -- 34. Electroluminescent Displays / William A. Barrow -- 35. Light-Emitting Diode Displays / Mohammad A. Karim -- 36. Reading/Recording Devices / Herman Vermarien, Edward McConnell and Yufeng Li.
Tags from this library: No tags from this library for this title. Log in to add tags.
Holdings
Item type Current library Call number Copy number Status Date due Barcode
Book City Campus City Campus Main Collection 621.381548 ELE (Browse shelf(Opens below)) 1 Available A413141B

Includes bibliographical references and index.

1. Voltage Measurement / Alessandro Ferrero, Jerry Murphy, Cipriano Bartoletti, Luca Podesta and Giancarlo Sacerdoti -- 2. Current Measurement / Douglas P. McNutt -- 3. Power Measurement / Pasquale Arpaia, Francesco Avallone, Aldo Baccigalupi, Claudio De Capua and Carmine Landi -- 4. Power Factor Measurement / Michael Z. Lowenstein -- 5. Phase Measurement / Peter O'Shea -- 6. Energy Measurement / Arnaldo Brandolini and Alessandro Gandelli -- 7. Electrical Conductivity and Resistivity / Michael B. Heaney -- 8. Charge Measurement / Saps Buchman, John Mester and Timothy J. Sumner -- 9. Capacitance and Capacitance Measurements / Halit Eren and James Goh -- 10. Permittivity Measurement / Devendra K. Misra -- 11. Electric Field Strength / David A. Hill and Motohisa Kanda -- 12. Magnetic Field Measurement / Steven A. Macintyre -- 13. Permeability and Hysteresis Measurement / Jeff P. Anderson and Richard J. Blotzer -- 14. Inductance Measurement / Michal Szyper -- 15. Immittance Measurement / Achim Dreher -- 16. Q Factor Measurement / Albert D. Helfrick -- 17. Distortion Measurement / Michael F. Toner and Gordon W. Roberts -- 18. Noise Measurement / W. Marshall Leach, Jr. -- 19. Microwave Measurement / A. Dehe, K. Beilenhoff, K. Fricke, H. Klingbeil, V. Krozer and H. L. Hartnagel -- 20. Amplifiers and Signal Conditioners / Ramon Pallas-Areny -- 21. Modulation / David M. Beams -- 22. Filters / Rahman Jamal and Robert Steer -- 23. Spectrum Analysis and Correlation / Ronney B. Panerai, A. Ambrosini, C. Bortolotti, N. D'Amico, G. Grueff, S. Mariotti, S. Montebugnoli, A. Orfei and G. Tomassetti -- 24. Applied Intelligence Processing / Peter H. Sydenham and Rodney Pratt -- 25. Analog-to-Digital Converters / E. B. Loewenstein -- 26. Computers / A. M. MacLeod, P. F. Martin and W. A. Gillespie -- 27. Telemetry / Albert Lozano-Nieto -- 28. Sensor Networks and Communication / Robert M. Crovella -- 29. Electromagnetic Compatibility / Daryl Gerke, William Kimmel and Jeffrey P. Mills -- 30. Human Factors in Displays / Steven A. Murray and Barrett S. Caldwell -- 31. Cathode Ray Tube Displays / Christopher J. Sherman -- 32. Liquid Crystal Displays / Kalluri R. Sarma -- 33. Plasma-Driven Flat Panel Displays / Robert T. McGrath, Ramanapathy Veerasingam, William C. Moffatt and Robert B. Campbell -- 34. Electroluminescent Displays / William A. Barrow -- 35. Light-Emitting Diode Displays / Mohammad A. Karim -- 36. Reading/Recording Devices / Herman Vermarien, Edward McConnell and Yufeng Li.

Machine converted from AACR2 source record.

There are no comments on this title.

to post a comment.

Powered by Koha