000			01952cam a2200421 i 4500
005			20221101232531.0
008			100921s2010 sz a b 101 ||eng d
011			_aBIB MATCHES WORLDCAT
020			_a0878492712
020			_a9780878492718
035			_a(ATU)b11796522
035			_a(OCoLC)656571063
040			_aATU _beng _erda _cATU _dATU
082	0	4	_a621.381548 _222
111	2		_aInternational Conference on Advanced Measurement and Test _d(2010 : _cSanya Shi, China) _9270191
245	1	0	_aAdvanced measurement and test : _bselected, peer reviewed papers from the 2010 International Conference on Advanced Measurement and Test (AMT 2010), May 15-16, 2010, Sanya, P.R. China / _cedited by Yanwen Wu.
246	3	0	_aInternational Conference on Advanced Measurement and Test
246	3	0	_aAMT 2010
264		1	_aStafa-Zurich, Switzerland ; _aEnfield, N.H. : _bTrans Tech Publications, _c[2010]
264		4	_c©2010
300			_a2 volumes (various pagings) : _billustrations ; _c25 cm.
336			_atext _btxt _2rdacontent
337			_aunmediated _bn _2rdamedia
338			_avolume _bnc _2rdacarrier
490	1		_aKey engineering materials, _x1013-9826 ; _vv. 439-440
504			_aIncludes bibliographical references and index.
588			_aMachine converted from AACR2 source record.
650		0	_aElectric measurements _vCongresses _9764799
650		0	_aElectronic measurements _vCongresses _9764809
650		0	_aMaterials _xTesting _vCongresses _9372947
700	1		_aWu, Yanwen, _eeditor. _91081715
830		0	_aKey engineering materials ; _vv. 439-440. _91032669
907			_a.b11796522 _b11-07-17 _c27-10-15
942			_cB
945			_a621.381548 INT _cPt. 1 _g1 _iA452098B _j0 _lcmain _o- _p$795.14 _q- _r- _s- _t0 _u0 _v0 _w0 _x0 _y.i13076243 _z29-10-15
945			_a621.381548 INT _cPt. 2 _g1 _iA452099B _j0 _lcmain _o- _p$794.14 _q- _r- _s- _t0 _u0 _v0 _w0 _x0 _y.i13076255 _z29-10-15
998			_a(2)b _a(2)c _b06-04-16 _cm _da _feng _gsz _h0
999			_c1213259 _d1213259