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005 | 20221101223054.0 | ||
008 | 091027s2008 ne a b 001 0 eng d | ||
010 | _a 2007048527 | ||
011 | _aBIB MATCHES WORLDCAT | ||
020 | _a0123695295 | ||
020 | _a9780123695291 | ||
035 | _a(ATU)b11599248 | ||
035 | _a(OCoLC)176924795 | ||
040 |
_aDLC _beng _erda _cDLC _dBTCTA _dYDXCP _dBAKER _dUKM _dC#P _dIXA _dGA0 _dATU |
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050 | 0 | 0 |
_aTK7874 _b.M86143 2008 |
082 | 0 | 0 |
_a621.3815 _222 |
100 | 1 |
_aMukherjee, Shubu, _eauthor. _91076003 |
|
245 | 1 | 0 |
_aArchitecture design for soft errors / _cShubu Mukherjee. |
264 | 1 |
_aAmsterdam ; _aBoston : _bMorgan Kaufmann Publishers/Elsevier, _c[2008] |
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264 | 4 | _c©2008 | |
300 |
_axxi, 337 pages : _billustrations ; _c25 cm |
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336 |
_atext _btxt _2rdacontent |
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337 |
_aunmediated _bn _2rdamedia |
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338 |
_avolume _bnc _2rdacarrier |
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504 | _aIncludes bibliographical references and index. | ||
505 | 0 | _aDevice- and circuit-level modeling, measurement, and mitigation -- Architectural vulnerability analysis -- Advanced architectural vulnerability analysis -- Error coding techniques -- Fault detection via redundant execution -- Hardware error recovery -- Software detection and recovery. | |
520 | _a"Soft errors represent very tiny radioactive glitches that occor on microchips. These glitches can result in corrupt data, system malfunctions, and loss of system reliability. Fixing soft errors presents a considerable cost and challenge for chip manufacturers, and this book, Architecture Design for Soft Errors, describes architectural techniques used to tackle soft errors. To provide readers with a better grasp of the problem definition and solution space, this book delves into physics of soft errors and reviews current circuit and software mitigation techniques as well. This book covers the new methodologies for quantitative analysis of soft errors as well as novel cost-effective architectural techniques to mitigate them. This book also re-evaluates traditional solutions in the context of the new quantitative analysis.* Provides the methodologies necessary to quantify the effect of radiation-induced soft errors as well as state-of-the-art techniques to protect against them"--Publisher description. | ||
588 | _aMachine converted from AACR2 source record. | ||
650 | 0 |
_aIntegrated circuits _9319425 |
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650 | 0 |
_aIntegrated circuits _xEffect of radiation on _9342154 |
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650 | 0 |
_aComputer architecture. _9315881 |
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650 | 0 |
_aSystem design _9324750 |
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