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005 20221101223054.0
008 091027s2008 ne a b 001 0 eng d
010 _a 2007048527
011 _aBIB MATCHES WORLDCAT
020 _a0123695295
020 _a9780123695291
035 _a(ATU)b11599248
035 _a(OCoLC)176924795
040 _aDLC
_beng
_erda
_cDLC
_dBTCTA
_dYDXCP
_dBAKER
_dUKM
_dC#P
_dIXA
_dGA0
_dATU
050 0 0 _aTK7874
_b.M86143 2008
082 0 0 _a621.3815
_222
100 1 _aMukherjee, Shubu,
_eauthor.
_91076003
245 1 0 _aArchitecture design for soft errors /
_cShubu Mukherjee.
264 1 _aAmsterdam ;
_aBoston :
_bMorgan Kaufmann Publishers/Elsevier,
_c[2008]
264 4 _c©2008
300 _axxi, 337 pages :
_billustrations ;
_c25 cm
336 _atext
_btxt
_2rdacontent
337 _aunmediated
_bn
_2rdamedia
338 _avolume
_bnc
_2rdacarrier
504 _aIncludes bibliographical references and index.
505 0 _aDevice- and circuit-level modeling, measurement, and mitigation -- Architectural vulnerability analysis -- Advanced architectural vulnerability analysis -- Error coding techniques -- Fault detection via redundant execution -- Hardware error recovery -- Software detection and recovery.
520 _a"Soft errors represent very tiny radioactive glitches that occor on microchips. These glitches can result in corrupt data, system malfunctions, and loss of system reliability. Fixing soft errors presents a considerable cost and challenge for chip manufacturers, and this book, Architecture Design for Soft Errors, describes architectural techniques used to tackle soft errors. To provide readers with a better grasp of the problem definition and solution space, this book delves into physics of soft errors and reviews current circuit and software mitigation techniques as well. This book covers the new methodologies for quantitative analysis of soft errors as well as novel cost-effective architectural techniques to mitigate them. This book also re-evaluates traditional solutions in the context of the new quantitative analysis.* Provides the methodologies necessary to quantify the effect of radiation-induced soft errors as well as state-of-the-art techniques to protect against them"--Publisher description.
588 _aMachine converted from AACR2 source record.
650 0 _aIntegrated circuits
_9319425
650 0 _aIntegrated circuits
_xEffect of radiation on
_9342154
650 0 _aComputer architecture.
_9315881
650 0 _aSystem design
_9324750
907 _a.b11599248
_b26-03-18
_c27-10-15
942 _cB
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