TY  - BOOK
AU  - Wu,Yanwen
ED  - International Conference on Advanced Measurement and Test
TI  - Advanced measurement and test: selected, peer reviewed papers from the 2010 International Conference on Advanced Measurement and Test (AMT 2010), May 15-16, 2010, Sanya, P.R. China 
T2  - Key engineering materials,
SN  - 0878492712
U1  - 621.381548 22
PY  - 2010///]
CY  - Stafa-Zurich, Switzerland, Enfield, N.H.
PB  - Trans Tech Publications
KW  - Electric measurements
KW  - Congresses
KW  - Electronic measurements
KW  - Materials
KW  - Testing
N1  - Includes bibliographical references and index
ER  -