Advanced measurement and test :  selected, peer reviewed papers from the 2010 International Conference on Advanced Measurement and Test (AMT 2010), May 15-16, 2010, Sanya, P.R. China / 
 International Conference on Advanced Measurement and Test  AMT 2010 
edited by Yanwen Wu. 
 - 2 volumes (various pagings) :  illustrations ;  25 cm. 
 - Key engineering materials,  v. 439-440  1013-9826 ; .
 - Key engineering materials ;  v. 439-440. .
<br/><br/>Includes bibliographical references and index. 
<br/><br/><label>ISBN: </label>0878492712 9780878492718 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Electric measurements--Congresses<br/>Electronic measurements--Congresses<br/>Materials--Testing--Congresses
<br/><br/><label>Dewey Class. No.: </label>621.381548