TY  - BOOK
AU  - Mukherjee,Shubu
TI  - Architecture design for soft errors
SN  - 0123695295
AV  - TK7874 .M86143 2008
U1  - 621.3815 22
PY  - 2008///]
CY  - Amsterdam, Boston
PB  - Morgan Kaufmann Publishers/Elsevier
KW  - Integrated circuits
KW  - Effect of radiation on
KW  - Computer architecture
KW  - System design
N1  - Includes bibliographical references and index; Device- and circuit-level modeling, measurement, and mitigation -- Architectural vulnerability analysis -- Advanced architectural vulnerability analysis -- Error coding techniques -- Fault detection via redundant execution -- Hardware error recovery -- Software detection and recovery
N2  - "Soft errors represent very tiny radioactive glitches that occor on microchips. These glitches can result in corrupt data, system malfunctions, and loss of system reliability. Fixing soft errors presents a considerable cost and challenge for chip manufacturers, and this book, Architecture Design for Soft Errors, describes architectural techniques used to tackle soft errors. To provide readers with a better grasp of the problem definition and solution space, this book delves into physics of soft errors and reviews current circuit and software mitigation techniques as well. This book covers the new methodologies for quantitative analysis of soft errors as well as novel cost-effective architectural techniques to mitigate them. This book also re-evaluates traditional solutions in the context of the new quantitative analysis.* Provides the methodologies necessary to quantify the effect of radiation-induced soft errors as well as state-of-the-art techniques to protect against them"--Publisher description
ER  -