Electrical measurement, signal processing, and displays / 
edited by John G. Webster. 
 - various pagings :  illustrations ;  27 cm. 
 - Principles and applications in engineering series .
 - Principles and applications in engineering. .
<br/><br/>Includes bibliographical references and index. 
<br/><br/> Voltage Measurement /  Current Measurement /  Power Measurement /  Power Factor Measurement /  Phase Measurement /  Energy Measurement /  Electrical Conductivity and Resistivity /  Charge Measurement /  Capacitance and Capacitance Measurements /  Permittivity Measurement /  Electric Field Strength /  Magnetic Field Measurement /  Permeability and Hysteresis Measurement /  Inductance Measurement /  Immittance Measurement /  Q Factor Measurement /  Distortion Measurement /  Noise Measurement /  Microwave Measurement /  Amplifiers and Signal Conditioners /  Modulation /  Filters /  Spectrum Analysis and Correlation /  Applied Intelligence Processing /  Analog-to-Digital Converters /  Computers /  Telemetry /  Sensor Networks and Communication /  Electromagnetic Compatibility /  Human Factors in Displays /  Cathode Ray Tube Displays /  Liquid Crystal Displays /  Plasma-Driven Flat Panel Displays /  Electroluminescent Displays /  Light-Emitting Diode Displays /  Reading/Recording Devices /  Alessandro Ferrero, Jerry Murphy, Cipriano Bartoletti, Luca Podesta and Giancarlo Sacerdoti --  Douglas P. McNutt --  Pasquale Arpaia, Francesco Avallone, Aldo Baccigalupi, Claudio De Capua and Carmine Landi --  Michael Z. Lowenstein --  Peter O'Shea --  Arnaldo Brandolini and Alessandro Gandelli --  Michael B. Heaney --  Saps Buchman, John Mester and Timothy J. Sumner --  Halit Eren and James Goh --  Devendra K. Misra --  David A. Hill and Motohisa Kanda --  Steven A. Macintyre --  Jeff P. Anderson and Richard J. Blotzer --  Michal Szyper --  Achim Dreher --  Albert D. Helfrick --  Michael F. Toner and Gordon W. Roberts --  W. Marshall Leach, Jr. --  A. Dehe, K. Beilenhoff, K. Fricke, H. Klingbeil, V. Krozer and H. L. Hartnagel --  Ramon Pallas-Areny --  David M. Beams --  Rahman Jamal and Robert Steer --  Ronney B. Panerai, A. Ambrosini, C. Bortolotti, N. D'Amico, G. Grueff, S. Mariotti, S. Montebugnoli, A. Orfei and G. Tomassetti --  Peter H. Sydenham and Rodney Pratt --  E. B. Loewenstein --  A. M. MacLeod, P. F. Martin and W. A. Gillespie --  Albert Lozano-Nieto --  Robert M. Crovella --  Daryl Gerke, William Kimmel and Jeffrey P. Mills --  Steven A. Murray and Barrett S. Caldwell --  Christopher J. Sherman --  Kalluri R. Sarma --  Robert T. McGrath, Ramanapathy Veerasingam, William C. Moffatt and Robert B. Campbell --  William A. Barrow --  Mohammad A. Karim --  Herman Vermarien, Edward McConnell and Yufeng Li.  1.  2.  3.  4.  5.  6.  7.  8.  9.  10.  11.  12.  13.  14.  15.  16.  17.  18.  19.  20.  21.  22.  23.  24.  25.  26.  27.  28.  29.  30.  31.  32.  33.  34.  35.  36. 
<br/><br/><label>ISBN: </label>0849317339 9780849317330 
<br/><br/><label>LCCN: </label>2003048530 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Electronic measurements<br/>Electric measurements<br/>Signal processing
<br/><br/><label>LC Class. No.: </label>TK7878  / .E435 2003 
<br/><br/><label>Dewey Class. No.: </label>621.381548